APT mass spectrometry and SEM data for CdTe solar cells☆
نویسندگان
چکیده
Atom probe tomography (APT) data acquired from a CAMECA LEAP 4000 XHR for the CdS/CdTe interface for a non-CdCl2 treated CdTe solar cell as well as the mass spectrum of an APT data set including a GB in a CdCl2-treated CdTe solar cell are presented. Scanning electron microscopy (SEM) data showing the evolution of sample preparation for APT and scanning transmission electron microscopy (STEM) electron beam induced current (EBIC) are also presented. These data show mass spectrometry peak decomposition of Cu and Te within an APT dataset, the CdS/CdTe interface of an untreated CdTe solar cell, preparation of APT needles from the CdS/CdTe interface in superstrate grown CdTe solar cells, and the preparation of a cross-sectional STEM EBIC sample.
منابع مشابه
The Effect of Change the Thickness on CdS/CdTe Tandem Multi-Junction Solar Cells Efficiency
Researchers in the field of simulation have been mainly interested in the question of how to increase the efficiency of solar cells. Therefore this study aimed to investigate CdS/CdTe solar cells by applying AMPS-1D software. The impact of semiconductor layers thickness on the output parameters of the CdS/CdTe solar cell is being analyzed and studied carefully, for example, fill factor, effici...
متن کاملAnalysis of Cu Diffusion in ZnTe-Based Contacts for Thin-Film CdS/CdTe Solar Cells
Ohmic contacts to thin-film CdS/CdTe photovoltaic devices have been formed using a two-layer contact interface of undoped ZnTe (ZnTe) and Cu-doped ZnTe (ZnTe:Cu), followed by Ni or Ti as an outer metallization. Secondary ion mass spectroscopy (SIMS) is used to study Cu diffusion within this back-contact structure, and also, to monitor Cu diffusion from the contact into the CdTe. When Ni metalli...
متن کاملThe Influence of Grain Boundary Diffusion on the Electro-Optical Properties of CdTe/CdS Solar Cells
We report on a study of the effects of diffusion of metals through polycyrstalline CdTe thin films. The metals Ni, Pd, Cu, Cr, and Te are deposited onto the back surface of 10-μm thick CdTe/CdS device structures using room-temperature evaporation. We found that four out of the five metals produce significant changes in the photoluminescence (PL) of the near-junction CdTe material. These changes...
متن کاملInvestigation of Physical Properties of e-Beam Evaporated CdTe Thin Films for Photovoltaic Application
CdTe thin films with 2.8 µm thickness were deposited by electron beam evaporation method. X-ray diffraction, scanning electron microscopy, UV-Vis-NIR spectroscopy and atomic force microscopy (AFM) were used to characterize the films. The results of AFM analysis revealed that the CdTe films have uniform surface. CdTe thin films were heat-treated by SnCl2 solution. Structural analysis using XRD s...
متن کاملCross-Section AFM and EFM Examination of Thin-Film Solar Cells
We demonstrated the feasibility of analyzing cross sections of thin-film CdTe/CdS and CIGS/CdS solar cells using atomic force microscopy (AFM). The AFM images were compared with images obtained with the scanning electron microscopy (SEM), and the correspondence was very good. We also used electrostatic force microscopy (EFM) [1] to image the distribution of the electrical potential on cross sec...
متن کامل